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Scanning electron microscopes are very powerful magnifying devices that analyze surface structures and material composition at a high level of resolution. Scanning transmission electron microscopy combines the principles of transmission electron microscopy and scanning electron microscopy. In STEM, a finely focused electron beam is scanned over the surface of a sample, and the electrons that pass through the sample are collected and used to create an image. Scanning microscopes are useful for investigating the internal structures of various objects, such as metals and ceramics. Scientists use SEM microscopes to observe the morphology of living cells and microorganisms.
Transmission electron microscopes use beams of electrons to create images of the internal structure of samples. The electrons pass through the sample, and the way they are scattered or absorbed by the atoms in the sample is used to construct an image. TEMs typically have very high resolution, on the order of a few angstroms, and are able to reveal details at the atomic and subatomic level. Scanning transmission electron microscopes have the dual capabilities of TEM and SEM microscopes. They provide high-resolution images of surfaces and internal structures.
When selecting a scanning electron microscope (SEM), there are several factors to consider. Resolution determines the level of detail for images. Resolution is measured in nanometers and varies depending on the type of SEM and the conditions under which it is used. Sample size is important. Larger samples and stages require larger units with a bigger field of view. Different SEMs have different imaging capabilities and are also equipped with additional detectors to perform energy dispersive spectroscopy (EDS) or cathodoluminescence (CL) imaging. Electron microscope cost varies as well. Try to justify the price with the features and capabilities that the electron microscope is used for.